Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3563573
DC FieldValue
dc.titleCombined effects of bilayer structure and ion substitutions on bismuth ferrite thin films
dc.contributor.authorWu, J.
dc.contributor.authorWang, J.
dc.contributor.authorXiao, D.
dc.contributor.authorZhu, J.
dc.date.accessioned2014-10-07T09:55:44Z
dc.date.available2014-10-07T09:55:44Z
dc.date.issued2011-04-01
dc.identifier.citationWu, J., Wang, J., Xiao, D., Zhu, J. (2011-04-01). Combined effects of bilayer structure and ion substitutions on bismuth ferrite thin films. Journal of Applied Physics 109 (7) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3563573
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/86865
dc.description.abstractTo understanding the combined effects of bilayer structure and ion substitutions on electrical behavior of BiFeO3 thin films, the Bi0.90La0.10Fe0.90Zn0.10O 3/Bi0.90La0.10Fe0.90Sn 0.10O3 bilayers with different thickness ratios were fabricated on SrRuO3/Pt/TiO2/SiO2/Si(100) substrates by radio frequency sputtering. Their dielectric constant increases and the fatigue endurance becomes better with increasing Bi 0.90La0.10Fe0.90Zn0.10O3 thickness ratios. The bilayer with the thickness ratio of 210: 90 exhibits a high remanent polarization, and a better fatigue behavior is induced by higher driving electric fields and frequencies. © 2011 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.3563573
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentMATERIALS SCIENCE AND ENGINEERING
dc.description.doi10.1063/1.3563573
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume109
dc.description.issue7
dc.description.page-
dc.description.codenJAPIA
dc.identifier.isiut000289949000098
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

15
checked on Jan 18, 2022

WEB OF SCIENCETM
Citations

11
checked on Jan 11, 2022

Page view(s)

177
checked on Jan 20, 2022

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.