Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.tsf.2008.02.007
DC FieldValue
dc.titleStructure and electrical properties of (100)-oriented Pb(Zn1/3Nb2/3)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 thin films on La0.7Sr0.3MnO3 electrode by chemical solution deposition
dc.contributor.authorHuang, A.
dc.contributor.authorYao, K.
dc.contributor.authorWang, J.
dc.date.accessioned2014-10-07T09:54:10Z
dc.date.available2014-10-07T09:54:10Z
dc.date.issued2008-06-02
dc.identifier.citationHuang, A., Yao, K., Wang, J. (2008-06-02). Structure and electrical properties of (100)-oriented Pb(Zn1/3Nb2/3)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 thin films on La0.7Sr0.3MnO3 electrode by chemical solution deposition. Thin Solid Films 516 (15) : 5057-5061. ScholarBank@NUS Repository. https://doi.org/10.1016/j.tsf.2008.02.007
dc.identifier.issn00406090
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/86733
dc.description.abstract(100)-oriented 0.462Pb(Zn1/3Nb2/3)O3-0.308Pb(Mg1/3Nb2/3)O3-0.23PbTiO3 (PZN-PMN-PT) perovskite ferroelectric thin films were prepared on La0.7Sr0.3MnO3/LaAlO3 (LSMO/LAO) substrate via a chemical solution deposition route. The perovskite LSMO electrode was found to effectively suppress the pyrochlore phase while promote the growth of the perovskite phase in the PZN-PMN-PT film. The film annealed at 700 °C exhibited a high dielectric constant of 2130 at 1 kHz, a remnant polarization, 2Pr, of 29.8 μC/cm2, and a low leakage current density of 7.2 × 10- 7 A/cm2 at an applied field of 200 kV/cm. The ferroelectric polarization was fatigue-free at least up to 1010 cycles. Piezoelectric coefficient, d33, of 48 pm/V was also demonstrated. The results showed that much superior properties could be achieved with the PZN-PMN-PT thin films on the solution derived LSMO electrode than on Pt electrode by sputtering. © 2008 Elsevier B.V. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.tsf.2008.02.007
dc.sourceScopus
dc.subjectchemical solution deposition
dc.subjectconductive oxide
dc.subjectferroelectric properties
dc.subjectperovskite
dc.subjectpiezoelectric effect
dc.typeArticle
dc.contributor.departmentMATERIALS SCIENCE AND ENGINEERING
dc.description.doi10.1016/j.tsf.2008.02.007
dc.description.sourcetitleThin Solid Films
dc.description.volume516
dc.description.issue15
dc.description.page5057-5061
dc.description.codenTHSFA
dc.identifier.isiut000256509100064
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