Please use this identifier to cite or link to this item: https://doi.org/10.1109/TMAG.2013.2286628
DC FieldValue
dc.titleMicrostructures and magnetic properties of FePt thin films on TiON intermediate layer
dc.contributor.authorLi, H.
dc.contributor.authorDong, K.
dc.contributor.authorPeng, Y.
dc.contributor.authorJu, G.
dc.contributor.authorChow, G.M.
dc.contributor.authorChen, J.-S.
dc.date.accessioned2014-10-07T09:51:58Z
dc.date.available2014-10-07T09:51:58Z
dc.date.issued2014
dc.identifier.citationLi, H., Dong, K., Peng, Y., Ju, G., Chow, G.M., Chen, J.-S. (2014). Microstructures and magnetic properties of FePt thin films on TiON intermediate layer. IEEE Transactions on Magnetics 50 (3) : 89-95. ScholarBank@NUS Repository. https://doi.org/10.1109/TMAG.2013.2286628
dc.identifier.issn00189464
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/86545
dc.description.abstractThe microstructures and magnetic properties of FePt(-SiOx-C) thin films grown on TiON and TiON/TiN intermediate layers were studied. TiON possessed smaller surface energy and smaller lattice constant than TiN. With increasing TiOx doping concentration, FePt grain shape changed from semi-spherical to square and grain size was significantly reduced. Meanwhile, good perpendicular magnetic anisotropy was retained, indicating that TiON intermediate layer could achieve a good balance between island growth and epitaxial growth. Furthermore, using TiON/TiN combined intermediate layer, FePt grain size was further reduced and the opening-up of in-plane M-H loop diminished. With 45 vol.% SiOx-25 vol.% C doping, well-isolated FePt grains with an average size as small as 5.7 nm and the grain size distribution of 0.9 nm were achieved. It also exhibited good perpendicular magnetic anisotropy with an out-of-plane coercivity of 18 kOe. © 2014 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TMAG.2013.2286628
dc.sourceScopus
dc.subjectFePt films
dc.subjectMicrostructure
dc.subjectPerpendicular media
dc.subjectTiON intermediate layer
dc.typeArticle
dc.contributor.departmentMATERIALS SCIENCE AND ENGINEERING
dc.description.doi10.1109/TMAG.2013.2286628
dc.description.sourcetitleIEEE Transactions on Magnetics
dc.description.volume50
dc.description.issue3
dc.description.page89-95
dc.description.codenIEMGA
dc.identifier.isiut000333747200017
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.