Labile ferroelastic nanodomains in bilayered ferroelectric thin films

Abstract

Labile ferroelastic nanodomains in bilayered ferroelectric thin films are analyzed. Bilayered thin-film structures comprising of a PbZr 0.3Ti0.7O3 deposited on top of a PbZr 0.7Ti0.3O3 were used in the experiment. The films were deposited by a multistep sol-gel route assisted by spin coating on Pt/Ti/SiO2/Si substrates. X-Ray-diffraction measurements ysung Philips X-pert MRD verified that the structure of the PZT layers was polycrystalline with a preferential orientation along the (001)/(100) direction with small fraction of (111) orientation. The typical gap between each pad was about 10μm. Ferroelectric hystersis loops and PUND measurements were performed using a Radiant Premier II at room temperature. Cross-sectional TEM analysis was performed using a JEOL 3000F TEM operated at an accelerating voltage of 300 KV.