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Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.jallcom.2011.05.076
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dc.titleCompositionally graded bismuth ferrite thin films
dc.contributor.authorWu, J.
dc.contributor.authorWang, J.
dc.contributor.authorXiao, D.
dc.contributor.authorZhu, J.
dc.date.accessioned2014-10-07T09:48:13Z
dc.date.available2014-10-07T09:48:13Z
dc.date.issued2011-09-01
dc.identifier.citationWu, J., Wang, J., Xiao, D., Zhu, J. (2011-09-01). Compositionally graded bismuth ferrite thin films. Journal of Alloys and Compounds 509 (35) : L319-L323. ScholarBank@NUS Repository. https://doi.org/10.1016/j.jallcom.2011.05.076
dc.identifier.issn09258388
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/86226
dc.description.abstractThe compositionally graded (Bi0.92La0.08)(Fe 1-xZnx)O3 (x = 0.03, 0.07, and 0.13) thin film was layer-by-layer grown on Pt/Ti/SiO2/Si(1 0 0) substrates without any buffer layers by radio frequency sputtering. This thin film has a pure polycrystalline perovskite structure with random orientation, a dense microstructure, and a low leakage current density. A large remanent polarization of 2Pr ∼ 142.00 μC/cm2 and a good magnetic behavior of 2 Ms ∼ 27.52 emu/cm3 are demonstrated in such a thin film. The applied electric fields and measurement frequencies strongly affect its fatigue endurance, that is, its fatigue endurance was degraded with decreasing frequencies and electric fields. © 2011 Elsevier B.V. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.jallcom.2011.05.076
dc.sourceScopus
dc.subjectBismuth ferrite
dc.subjectCompositionally graded thin film
dc.subjectFatigue behavior
dc.subjectMultiferroic properties
dc.typeArticle
dc.contributor.departmentMATERIALS SCIENCE AND ENGINEERING
dc.description.doi10.1016/j.jallcom.2011.05.076
dc.description.sourcetitleJournal of Alloys and Compounds
dc.description.volume509
dc.description.issue35
dc.description.pageL319-L323
dc.description.codenJALCE
dc.identifier.isiut000293824600001
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