High coercivity FePt thin films with Ag intermediate layers deposited at 400°C

Please use this identifier to cite or link to this item: https://doi.org/10.1109/TMAG.2005.855204

Title:	High coercivity FePt thin films with Ag intermediate layers deposited at 400°C
Authors:	Zhao, Z.L. Chen, J.S. Ding, J. Yi, J.B. Liu, B.H. Wang, J.P.
Keywords:	Ag Epitaxial growth FePt High coercivity Intermediate layer MgO Perpendicular magnetic recording
Issue Date:	Oct-2005
Citation:	Zhao, Z.L., Chen, J.S., Ding, J., Yi, J.B., Liu, B.H., Wang, J.P. (2005-10). High coercivity FePt thin films with Ag intermediate layers deposited at 400°C. IEEE Transactions on Magnetics 41 (10) : 3337-3339. ScholarBank@NUS Repository. https://doi.org/10.1109/TMAG.2005.855204
Abstract:	L10 phase FePt thin films deposited on amorphous Corning glasses and single crystal MgO (100) substrates were investigated. Epitaxial growth of the FePt (001) films was observed on MgO substrate at a deposition temperature of 400°C. With ultrathin Ag intermediate layers deposited between FePt layers, the film structure changed from interconnection network to isolated-island character. The perpendicular coercivity of the FePt film increased to about 32 kOe with intermediate layers inserted. The improvement of the magnetic properties may be attributed to the formation of island structures by the additive Ag layers in the FePt films. © 2005 IEEE.
Source Title:	IEEE Transactions on Magnetics
URI:	http://scholarbank.nus.edu.sg/handle/10635/85985
ISSN:	00189464
DOI:	10.1109/TMAG.2005.855204
Appears in Collections:	Staff Publications

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