Please use this identifier to cite or link to this item: https://doi.org/10.1007/s10008-011-1545-y
DC FieldValue
dc.titleCycling effects on interfacial reliability of TiO 2 anode film in thin film lithium-ion microbatteries
dc.contributor.authorZhu, J.
dc.contributor.authorZeng, K.
dc.contributor.authorLu, L.
dc.date.accessioned2014-10-07T09:13:39Z
dc.date.available2014-10-07T09:13:39Z
dc.date.issued2012-05
dc.identifier.citationZhu, J., Zeng, K., Lu, L. (2012-05). Cycling effects on interfacial reliability of TiO 2 anode film in thin film lithium-ion microbatteries. Journal of Solid State Electrochemistry 16 (5) : 1877-1881. ScholarBank@NUS Repository. https://doi.org/10.1007/s10008-011-1545-y
dc.identifier.issn14328488
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/85912
dc.description.abstractThis work presents a comprehensive study on the cycling effects on morphological, nanomechanical, and interfacial properties of sputtered TiO 2 anode film during discharge/charge cycling. TiO 2 film mechanically fails due to the repeated volume change and related generation/ relaxation of stress induced by electrochemical phase transformation. The induced stress intensifies the initiation/ propagation of cracks, also the interfacial delamination. Both morphology and mechanical property changes have harmful effects on the electrical contact, resulting in the battery aging. This paper also demonstrates that the experiment and analysis method is effective to characterize the interfacial reliability within thin film microbatteries.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1007/s10008-011-1545-y
dc.sourceScopus
dc.subjectInterfacial reliability
dc.subjectNanoindentation
dc.subjectThin film lithium-ion battery
dc.subjectTiO 2
dc.typeConference Paper
dc.contributor.departmentMECHANICAL ENGINEERING
dc.description.doi10.1007/s10008-011-1545-y
dc.description.sourcetitleJournal of Solid State Electrochemistry
dc.description.volume16
dc.description.issue5
dc.description.page1877-1881
dc.identifier.isiut000303451100019
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