Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1631750
DC FieldValue
dc.titleX-ray diffraction and photoelectron spectroscopic studies of (001)-oriented Pb(Zr0.52Ti0.48)O3 thin films prepared by laser ablation
dc.contributor.authorZhu, T.J.
dc.contributor.authorLu, L.
dc.date.accessioned2014-10-07T09:12:51Z
dc.date.available2014-10-07T09:12:51Z
dc.date.issued2004-01-01
dc.identifier.citationZhu, T.J., Lu, L. (2004-01-01). X-ray diffraction and photoelectron spectroscopic studies of (001)-oriented Pb(Zr0.52Ti0.48)O3 thin films prepared by laser ablation. Journal of Applied Physics 95 (1) : 241-247. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1631750
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/85842
dc.description.abstractPulsed laser deposition (PLD) method was used in order to fabricate (001)-oriented Pb(Zr0.52Ti0.48)O3 (PZT) thin films on LAO substrates with LaNiO3 (LNO) films as bottom electrodes because of their low resistivities and suitable lattice constants. Both LAO and LNO possess the perovskite structure and their lattice parameters were, respectively, 0.379 nm and 0.386 nm. This paper investigates the crystallographic and photoelectron spectroscope of the oriented PZT/LNO thin films grown under various oxygen pressures by the PLD method.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.1631750
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentMECHANICAL ENGINEERING
dc.contributor.departmentSINGAPORE-MIT ALLIANCE
dc.description.doi10.1063/1.1631750
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume95
dc.description.issue1
dc.description.page241-247
dc.description.codenJAPIA
dc.identifier.isiut000187341900039
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