Please use this identifier to cite or link to this item: https://doi.org/10.1088/0957-4484/16/4/014
DC FieldValue
dc.titleGrowth of Si nanowires by thermal evaporation
dc.contributor.authorPan, H.
dc.contributor.authorLim, S.
dc.contributor.authorPoh, C.
dc.contributor.authorSun, H.
dc.contributor.authorWu, X.
dc.contributor.authorFeng, Y.
dc.contributor.authorLin, J.
dc.date.accessioned2014-10-07T09:05:51Z
dc.date.available2014-10-07T09:05:51Z
dc.date.issued2005-04
dc.identifier.citationPan, H., Lim, S., Poh, C., Sun, H., Wu, X., Feng, Y., Lin, J. (2005-04). Growth of Si nanowires by thermal evaporation. Nanotechnology 16 (4) : 417-421. ScholarBank@NUS Repository. https://doi.org/10.1088/0957-4484/16/4/014
dc.identifier.issn09574484
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/85254
dc.description.abstractSi nanowires have been produced in high yield on Si substrate with the absence of a catalyst by thermal evaporation at high temperature. The self-induced growth of Si nanowires suggests that a catalyst should be not essential. Transmission electron microscopic investigation shows that the nanowires, with a diameter ranging from 10 to 100 nm and length up to a few hundred microns, are crystalline or amorphous. The self-induced solid-liquid-solid model and oxygen-assisted vapour-solid mode are employed to explain the results. Raman spectroscopy shows an asymmetric peak around 512 cm -1, with a deviation of 9 cm -1 from that of the bulk crystalline Si. XRD and TEM were used to characterize the Si nanowires. The effects of growth conditions on quality and production were investigated. © 2005 IOP Publishing Ltd.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.contributor.departmentMECHANICAL ENGINEERING
dc.description.doi10.1088/0957-4484/16/4/014
dc.description.sourcetitleNanotechnology
dc.description.volume16
dc.description.issue4
dc.description.page417-421
dc.description.codenNNOTE
dc.identifier.isiut000228949300023
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