Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.2362643
DC FieldValue
dc.titleGrain size reduction in CoCrPt:SiO2 perpendicular recording media with oxide-based intermediate layers
dc.contributor.authorPiramanayagam, S.N.
dc.contributor.authorPock, C.K.
dc.contributor.authorLu, L.
dc.contributor.authorOng, C.Y.
dc.contributor.authorShi, J.Z.
dc.contributor.authorMah, C.S.
dc.date.accessioned2014-10-07T09:05:44Z
dc.date.available2014-10-07T09:05:44Z
dc.date.issued2006
dc.identifier.citationPiramanayagam, S.N., Pock, C.K., Lu, L., Ong, C.Y., Shi, J.Z., Mah, C.S. (2006). Grain size reduction in CoCrPt:SiO2 perpendicular recording media with oxide-based intermediate layers. Applied Physics Letters 89 (16) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2362643
dc.identifier.issn00036951
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/85243
dc.description.abstractCoCrPt-Si O2 perpendicular recording media containing an oxide-based intermediate layer have been studied in order to minimize the grain size in the recording layer. A RuCr alloy thin film deposited in an argon and oxygen reactive atmosphere was found to produce finer grains in the intermediate layer. When the recording layer was deposited on such an intermediate layer, the grain size of the recording layer was also observed to be smaller (about 6.4 nm center-to-center distances). The results indicate that the introduction of RuCr-oxide-based intermediate layers is a possible approach to reduce the grain size in perpendicular recording media. © 2006 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.2362643
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentMECHANICAL ENGINEERING
dc.description.doi10.1063/1.2362643
dc.description.sourcetitleApplied Physics Letters
dc.description.volume89
dc.description.issue16
dc.description.page-
dc.description.codenAPPLA
dc.identifier.isiut000241405200060
Appears in Collections:Staff Publications

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