Please use this identifier to cite or link to this item: https://doi.org/10.1504/IJNT.2014.059833
DC FieldValue
dc.titleEffect of trap depth and interfacial energy barrier on charge transport in inverted organic solar cells employing nanostructured ZnO as electron buffer layer
dc.contributor.authorElumalai, N.K.
dc.contributor.authorVijila, C.
dc.contributor.authorJose, R.
dc.contributor.authorJie, Z.
dc.contributor.authorRamakrishna, S.
dc.date.accessioned2014-10-07T09:03:37Z
dc.date.available2014-10-07T09:03:37Z
dc.date.issued2014
dc.identifier.citationElumalai, N.K., Vijila, C., Jose, R., Jie, Z., Ramakrishna, S. (2014). Effect of trap depth and interfacial energy barrier on charge transport in inverted organic solar cells employing nanostructured ZnO as electron buffer layer. International Journal of Nanotechnology 11 (1-4) : 322-332. ScholarBank@NUS Repository. https://doi.org/10.1504/IJNT.2014.059833
dc.identifier.issn14757435
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/85069
dc.description.abstractInverted organic solar cells with device structure ITO/ZnO/poly (3-hexylthiophene) (P3HT):[6,6]-phenyl C61 butyric acid methyl ester (PCBM)/ MoO3/Ag were fabricated employing low temperature solution processed ZnO as electron selective layer. Devices with varying film thickness of ZnO interlayer were investigated. The optimum film thickness was determined from photovoltaic parameters obtained from current-voltage measurements. Furthermore, the distribution of localised energy states or trap depth and the ohmicity of the contacts in the optimised device were evaluated, using the temperature and illumination intensity dependent study. The results demonstrate the effect of trap depth distribution on the charge transport, device performance, and stability of the contacts. Copyright © 2014 Inderscience Enterprises Ltd.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1504/IJNT.2014.059833
dc.sourceScopus
dc.subjectCharge transport
dc.subjectElectron selective layer
dc.subjectSolution processed
dc.subjectTemperature dependence
dc.subjectTrap depth
dc.subjectZinc oxide
dc.typeArticle
dc.contributor.departmentMECHANICAL ENGINEERING
dc.description.doi10.1504/IJNT.2014.059833
dc.description.sourcetitleInternational Journal of Nanotechnology
dc.description.volume11
dc.description.issue1-4
dc.description.page322-332
dc.identifier.isiut000333193300029
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.