Please use this identifier to cite or link to this item:
https://doi.org/10.1109/PVSC.2010.5617187
DC Field | Value | |
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dc.title | Semiconducting β-FeSi2 for high efficiency and low cost photovoltaics | |
dc.contributor.author | Kumar, A. | |
dc.contributor.author | Chi, D. | |
dc.contributor.author | Verma, L.K. | |
dc.contributor.author | Danner, A.J. | |
dc.contributor.author | Yang, H. | |
dc.contributor.author | Bhati, C.S. | |
dc.date.accessioned | 2014-10-07T04:49:37Z | |
dc.date.available | 2014-10-07T04:49:37Z | |
dc.date.issued | 2010 | |
dc.identifier.citation | Kumar, A., Chi, D., Verma, L.K., Danner, A.J., Yang, H., Bhati, C.S. (2010). Semiconducting β-FeSi2 for high efficiency and low cost photovoltaics. Conference Record of the IEEE Photovoltaic Specialists Conference : 3359-3364. ScholarBank@NUS Repository. https://doi.org/10.1109/PVSC.2010.5617187 | |
dc.identifier.isbn | 9781424458912 | |
dc.identifier.issn | 01608371 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/84171 | |
dc.description.abstract | The beta phase of iron disilicide, β-FeSi2, behaves as a semiconductor and possesses three desirable material properties: direct band gap of around 0.87 eV, close lattice match with silicon (2-4% mismatch) and abundant availability of its constituent elements on the earth's crust. Moreover, its high optical absorption coefficient (one to two orders of magnitude higher than silicon) makes it a promising next generation semiconductor for photovoltaics with high performance and low environmental burden. The purpose of this work is to examine fundamental properties of β-FeSi2 material for application towards higher efficiency and low cost photovoltaics. Sputter deposition of Fe/Si multilayers was used to fabricate β-FeSi2 films. Conversion of the multilayer films to β-FeSi2 was accomplished by a thermal treatment under N 2atmosphere. β-FeSi2 films fabricated exhibited polycrystalline grains, with a direct energy band gap of 0.87 eV, an absorption coefficient in the order of 105 cm-1 and a residual carrier concentration due to electrons in the order of 1019 cm-3. Results of characterization using x-ray photoelectron spectroscopy, x-ray diffraction, scanning electron microscopy, UV-VIS-IR spectrophotometer measurements and Hall effect measurements have been discussed. © 2010 IEEE. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/PVSC.2010.5617187 | |
dc.source | Scopus | |
dc.type | Conference Paper | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1109/PVSC.2010.5617187 | |
dc.description.sourcetitle | Conference Record of the IEEE Photovoltaic Specialists Conference | |
dc.description.page | 3359-3364 | |
dc.description.coden | CRCND | |
dc.identifier.isiut | 000287579503132 | |
Appears in Collections: | Staff Publications |
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