Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/84121
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dc.titleRaman scattering spectra in C-implanted GaN epilayers
dc.contributor.authorSun, W.H.
dc.contributor.authorChua, S.J.
dc.contributor.authorZhang, J.
dc.contributor.authorWang, L.S.
dc.contributor.authorHao, M.S.
dc.contributor.authorChen, K.M.
dc.contributor.authorQin, G.G.
dc.date.accessioned2014-10-07T04:49:03Z
dc.date.available2014-10-07T04:49:03Z
dc.date.issued2001
dc.identifier.citationSun, W.H.,Chua, S.J.,Zhang, J.,Wang, L.S.,Hao, M.S.,Chen, K.M.,Qin, G.G. (2001). Raman scattering spectra in C-implanted GaN epilayers. Materials Research Society Symposium Proceedings 680 : 256-261. ScholarBank@NUS Repository.
dc.identifier.isbn1558996168
dc.identifier.issn02729172
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/84121
dc.description.abstractWe have investigated the Raman scattering spectra in C-implanted GaN epilayers. (a) In as-implanted GaN, new Raman bands at 293, 376, 669, 1027, 1094 and 1053 cm-1 appeared. From phonon-dispersion curves for hexagonal GaN, the 293 cm-1 and 669 cm-1 bands were tentatively assigned to the highest acoustic-phonon branch and the optical-phonon branch at the Brillouin zone boundaries, respectively; the 1027 and 1094 cm-1 peaks might be caused by two-phonon scattering involving the 376 and 669 cm -1 phonons, and the 376 cm-1 and AI(LO) phonons respectively. (b) Two sharp bands at ∼1350 and ∼1600 cm-1 were observed in the Raman spectra of carbon-implanted GaN after post-implantation annealing treatments. The intensities of these two bands increased while their full widths at half maximum decreased with increasing annealing temperature. We assigned them, respectively, to the D and G bands of small graphite crystallites arising from C implantation and post-implantation annealing. The observation of these two bands indicates the formation of small graphite crystallites in C-implanted GaN. © 2001 Materials Research Society.
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.sourcetitleMaterials Research Society Symposium Proceedings
dc.description.volume680
dc.description.page256-261
dc.description.codenMRSPD
dc.identifier.isiutNOT_IN_WOS
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