Please use this identifier to cite or link to this item: https://doi.org/10.1109/IEDM.2012.6479062
DC FieldValue
dc.titlePerformance comparison of III-V MOSFETs with source filter for electron energy
dc.contributor.authorLam, K.-T.
dc.contributor.authorYeo, Y.-C.
dc.contributor.authorLiang, G.
dc.date.accessioned2014-10-07T04:48:30Z
dc.date.available2014-10-07T04:48:30Z
dc.date.issued2012
dc.identifier.citationLam, K.-T.,Yeo, Y.-C.,Liang, G. (2012). Performance comparison of III-V MOSFETs with source filter for electron energy. Technical Digest - International Electron Devices Meeting, IEDM : 17.6.1-17.6.4. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IEDM.2012.6479062" target="_blank">https://doi.org/10.1109/IEDM.2012.6479062</a>
dc.identifier.isbn9781467348706
dc.identifier.issn01631918
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/84075
dc.description.abstractWe evaluated the performances of two high-energy-electrons filtering MOSFET designs, the superlattice source-extension (SL) MOSFET and the p +/n+ source-junction (p+n+ source) MOSFET, using the sp3d5s full-band tight-binding model, coupled with a non-equilibrium Green's function quantum transport simulator in the ballistic regime. III-V semicoductor heterojunctions made up of GaAs and In53Ga47As are investigated and the optimizing parameters such as the length of the barrier and well regions for the SL-MOSFETs and the doping concentrations and the length of n+ region for the p +n+ source MOSFETs are varied to understand their effects on the device performance parameters. More detailed interactions between electrons are considered in the present full-band simulations. Our optimized SL-MOSFET and p+n+ source MOSFET achieve ION = 0.81 and 0.60 mA/μm, SS = 20.9 and 23.1mV/dec@VDS=0.6V, respectively. © 2012 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/IEDM.2012.6479062
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/IEDM.2012.6479062
dc.description.sourcetitleTechnical Digest - International Electron Devices Meeting, IEDM
dc.description.page17.6.1-17.6.4
dc.description.codenTDIMD
dc.identifier.isiutNOT_IN_WOS
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