Please use this identifier to cite or link to this item:
https://doi.org/10.1109/IEDM.2012.6479062
DC Field | Value | |
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dc.title | Performance comparison of III-V MOSFETs with source filter for electron energy | |
dc.contributor.author | Lam, K.-T. | |
dc.contributor.author | Yeo, Y.-C. | |
dc.contributor.author | Liang, G. | |
dc.date.accessioned | 2014-10-07T04:48:30Z | |
dc.date.available | 2014-10-07T04:48:30Z | |
dc.date.issued | 2012 | |
dc.identifier.citation | Lam, K.-T.,Yeo, Y.-C.,Liang, G. (2012). Performance comparison of III-V MOSFETs with source filter for electron energy. Technical Digest - International Electron Devices Meeting, IEDM : 17.6.1-17.6.4. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IEDM.2012.6479062" target="_blank">https://doi.org/10.1109/IEDM.2012.6479062</a> | |
dc.identifier.isbn | 9781467348706 | |
dc.identifier.issn | 01631918 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/84075 | |
dc.description.abstract | We evaluated the performances of two high-energy-electrons filtering MOSFET designs, the superlattice source-extension (SL) MOSFET and the p +/n+ source-junction (p+n+ source) MOSFET, using the sp3d5s full-band tight-binding model, coupled with a non-equilibrium Green's function quantum transport simulator in the ballistic regime. III-V semicoductor heterojunctions made up of GaAs and In53Ga47As are investigated and the optimizing parameters such as the length of the barrier and well regions for the SL-MOSFETs and the doping concentrations and the length of n+ region for the p +n+ source MOSFETs are varied to understand their effects on the device performance parameters. More detailed interactions between electrons are considered in the present full-band simulations. Our optimized SL-MOSFET and p+n+ source MOSFET achieve ION = 0.81 and 0.60 mA/μm, SS = 20.9 and 23.1mV/dec@VDS=0.6V, respectively. © 2012 IEEE. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/IEDM.2012.6479062 | |
dc.source | Scopus | |
dc.type | Conference Paper | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1109/IEDM.2012.6479062 | |
dc.description.sourcetitle | Technical Digest - International Electron Devices Meeting, IEDM | |
dc.description.page | 17.6.1-17.6.4 | |
dc.description.coden | TDIMD | |
dc.identifier.isiut | NOT_IN_WOS | |
Appears in Collections: | Staff Publications |
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