Please use this identifier to cite or link to this item: https://doi.org/10.1166/jnn.2011.2702
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dc.titleInterlayer exchange coupling effect of L1 0 CoPt based exchange coupled composite media
dc.contributor.authorYang, Y.
dc.contributor.authorPandey, K.K.M.
dc.contributor.authorChen, J.S.
dc.contributor.authorChow, G.M.
dc.contributor.authorHu, J.F.
dc.date.accessioned2014-10-07T04:45:59Z
dc.date.available2014-10-07T04:45:59Z
dc.date.issued2011-03
dc.identifier.citationYang, Y., Pandey, K.K.M., Chen, J.S., Chow, G.M., Hu, J.F. (2011-03). Interlayer exchange coupling effect of L1 0 CoPt based exchange coupled composite media. Journal of Nanoscience and Nanotechnology 11 (3) : 2607-2610. ScholarBank@NUS Repository. https://doi.org/10.1166/jnn.2011.2702
dc.identifier.issn15334880
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/83856
dc.description.abstractIn this work, effects of exchange coupling of soft magnetic layer on switching field and magnetization reversal behaviour of CoPt-SiO 2(soft)/CoPt-SiO 2(hard) exchange coupled media were investigated. With increasing the thickness of the soft layer, both the coercivity and magnetization squareness of composite media decreased. Soft layer thickness 4 nm and below was more effective to significantly reduce the switching field than that above 4 nm. More incoherent switching behavior was observed with increasing soft layer thickness. © 2011 American Scientific Publishers.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1166/jnn.2011.2702
dc.sourceScopus
dc.subjectExchange coupled media
dc.subjectL1 0 CoPt
dc.subjectReduced switching field
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.contributor.departmentMATERIALS SCIENCE AND ENGINEERING
dc.description.doi10.1166/jnn.2011.2702
dc.description.sourcetitleJournal of Nanoscience and Nanotechnology
dc.description.volume11
dc.description.issue3
dc.description.page2607-2610
dc.identifier.isiut000288102300120
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