Please use this identifier to cite or link to this item: https://doi.org/10.1143/JJAP.50.01AF02
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dc.titleGrowth of two-dimensional carbon nanostructures and their electrical transport properties at low tempertaure
dc.contributor.authorWu, Y.
dc.contributor.authorWang, H.
dc.contributor.authorChoong, C.
dc.date.accessioned2014-10-07T04:44:58Z
dc.date.available2014-10-07T04:44:58Z
dc.date.issued2011-01
dc.identifier.citationWu, Y., Wang, H., Choong, C. (2011-01). Growth of two-dimensional carbon nanostructures and their electrical transport properties at low tempertaure. Japanese Journal of Applied Physics 50 (1 PART 2) : -. ScholarBank@NUS Repository. https://doi.org/10.1143/JJAP.50.01AF02
dc.identifier.issn00214922
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/83769
dc.description.abstractWe report on a systematic electrical transport study of carbon nanowalls using both the normal metal and superconducting electrodes. The nonlinear transport and corresponding anomalous dI/dV versus bias curves below ∼2 K observed in samples with both Ti and Nb electrodes is accounted for by the formation of charge density waves due to enhanced density of states at the Fermi level at edges or extended defects. This phase competes with superconducting instability at very low temperature, as manifested by distinctive resistance-temperature behaviors and associated dV/dI characteristics observed in different samples. © 2011 The Japan Society of Applied Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1143/JJAP.50.01AF02
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1143/JJAP.50.01AF02
dc.description.sourcetitleJapanese Journal of Applied Physics
dc.description.volume50
dc.description.issue1 PART 2
dc.description.page-
dc.identifier.isiut000287522400028
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