Please use this identifier to cite or link to this item: https://doi.org/10.1117/12.456874
DC FieldValue
dc.titleFilm growth on single MgO and SiO2 covered Si substrate by pulsed laser deposition
dc.contributor.authorSu, Y.
dc.contributor.authorZhao, J.
dc.contributor.authorLü, L.
dc.contributor.authorLai, M.O.
dc.contributor.authorSong, W.D.
dc.contributor.authorLu, Y.F.
dc.date.accessioned2014-10-07T04:44:38Z
dc.date.available2014-10-07T04:44:38Z
dc.date.issued2002
dc.identifier.citationSu, Y., Zhao, J., Lü, L., Lai, M.O., Song, W.D., Lu, Y.F. (2002). Film growth on single MgO and SiO2 covered Si substrate by pulsed laser deposition. Proceedings of SPIE - The International Society for Optical Engineering 4426 : 248-251. ScholarBank@NUS Repository. https://doi.org/10.1117/12.456874
dc.identifier.issn0277786X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/83741
dc.description.abstractSTO and subsequent YBCO thin films with different orienations have been grown on a single crystal MgO (100) substrate as well as a MgO on a 400 nm amorphous SiO2 covered Si (100) substrate using pulsed laser deposition (PLD) technique. Cross-sectional transmission electron microscopy (TEM) showed an epitaxial growth of highly c-axis oriented YBCO(001)/STO(100) on a single crystal MgO (100). TEM investigation on MgO/SiO2 interface revealed a columnar growth of MgO film with a certain thin interlayer existing between SiO2 and MgO indicating interfacial reaction between SiO2 and MgO. Chemical reaction may be possible at the interface when films are hold at high temperature based on the calculation of Gibbs free energy. Auger electron spectroscopy (AES) showed that an up-hill diffusion of Ba from YBCO occured during deposition and post thermal treatment processes.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1117/12.456874
dc.sourceScopus
dc.subjectDiffusion
dc.subjectEpitaxial growth
dc.subjectInterface
dc.subjectMgO
dc.subjectPLD
dc.subjectSTO
dc.subjectYBCO
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.contributor.departmentMECHANICAL ENGINEERING
dc.contributor.departmentDATA STORAGE INSTITUTE
dc.description.doi10.1117/12.456874
dc.description.sourcetitleProceedings of SPIE - The International Society for Optical Engineering
dc.description.volume4426
dc.description.page248-251
dc.description.codenPSISD
dc.identifier.isiut000176422100055
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

1
checked on Nov 15, 2019

Page view(s)

54
checked on Oct 27, 2019

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.