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Please use this identifier to cite or link to this item: https://doi.org/10.1109/OMN.2013.6659094
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dc.titleExperimental verification of phononic crystal slab based silicon microresonators
dc.contributor.authorWang, N.
dc.contributor.authorTang, M.
dc.contributor.authorHsiao, F.-L.
dc.contributor.authorHo, C.P.
dc.contributor.authorPalaniapan, M.
dc.contributor.authorKwong, D.-L.
dc.contributor.authorLee, C.
dc.date.accessioned2014-10-07T04:44:21Z
dc.date.available2014-10-07T04:44:21Z
dc.date.issued2013
dc.identifier.citationWang, N.,Tang, M.,Hsiao, F.-L.,Ho, C.P.,Palaniapan, M.,Kwong, D.-L.,Lee, C. (2013). Experimental verification of phononic crystal slab based silicon microresonators. International Conference on Optical MEMS and Nanophotonics : 131-132. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/OMN.2013.6659094" target="_blank">https://doi.org/10.1109/OMN.2013.6659094</a>
dc.identifier.isbn9781479915125
dc.identifier.issn21605033
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/83714
dc.description.abstractThis paper reports experimentally measured data of two microfabricated resonators, namely a Fabry-Perot (FP) resonator and a reduced central-hole (RCH) resonator, formed by engineering different defects on an otherwise perfect phononic crystal (PnC) slab. Experimental results, which are well supported by the numerically simulated data, show that the RCH resonator has higher Q factor, higher resonant frequency and lower insertion loss than the FP resonator. Finite-element-modelling (FEM) analysed steady-state displacement profiles of the two resonators show that the higher Q factor obtained by the RCH resonator is caused by its superior ability of the energy confinement within the defected region. © 2013 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/OMN.2013.6659094
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/OMN.2013.6659094
dc.description.sourcetitleInternational Conference on Optical MEMS and Nanophotonics
dc.description.page131-132
dc.identifier.isiutNOT_IN_WOS
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