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https://doi.org/10.1109/66.999586
DC Field | Value | |
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dc.title | Supply-voltage optimization for below-70-nm technology-node MOSFETs | |
dc.contributor.author | Wakabayashi, H. | |
dc.contributor.author | Samudra, G.S. | |
dc.contributor.author | Djomehri, I.J. | |
dc.contributor.author | Nayfeh, H. | |
dc.contributor.author | Antoniadis, D.A. | |
dc.date.accessioned | 2014-10-07T04:37:28Z | |
dc.date.available | 2014-10-07T04:37:28Z | |
dc.date.issued | 2002-05 | |
dc.identifier.citation | Wakabayashi, H., Samudra, G.S., Djomehri, I.J., Nayfeh, H., Antoniadis, D.A. (2002-05). Supply-voltage optimization for below-70-nm technology-node MOSFETs. IEEE Transactions on Semiconductor Manufacturing 15 (2) : 151-156. ScholarBank@NUS Repository. https://doi.org/10.1109/66.999586 | |
dc.identifier.issn | 08946507 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/83117 | |
dc.description.abstract | A tradeoff between the performance and power consumption is discussed for below-70-nm technology-node MOSFETs, as a function of power-supply voltage. In order to optimize the supply voltage, gate-delay (CV/I)and energy-delay product (C 2V 3/I) trends are evaluated using the characteristics of down to 24-nm physical-gate-length nMOSFETs. The gate-delay dependence on the supply voltage down to 0.9 V is almost constant at the same OFF current of 100 nA/μm. On the other hand, an optimum supply voltage for the energy-delay product significantly depends on the short-channel characteristics, and is interpreted with analytic expressions. Therefore, for the below-70-nm technology node at sub-1.0 V, it is important to design the power-supply voltage taking into consideration of a short-channel effect (SCE). | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/66.999586 | |
dc.source | Scopus | |
dc.subject | CMOS | |
dc.subject | Energy-delay product | |
dc.subject | Gate delay | |
dc.subject | Power consumption | |
dc.subject | Power-supply voltage | |
dc.subject | Short-channel effect | |
dc.type | Article | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1109/66.999586 | |
dc.description.sourcetitle | IEEE Transactions on Semiconductor Manufacturing | |
dc.description.volume | 15 | |
dc.description.issue | 2 | |
dc.description.page | 151-156 | |
dc.description.coden | ITSME | |
dc.identifier.isiut | 000175398400004 | |
Appears in Collections: | Staff Publications |
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