Please use this identifier to cite or link to this item: https://doi.org/10.1002/pip.866
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dc.titleShunting problems due to sub-micron pinholes in evaporated solid-phase crystallised poly-Si thin-film solar cells on glass
dc.contributor.authorKunz, O.
dc.contributor.authorWong, J.
dc.contributor.authorJanssens, J.
dc.contributor.authorBauer, J.
dc.contributor.authorBreitenstein, O.
dc.contributor.authorAberle, A.G.
dc.date.accessioned2014-10-07T04:36:13Z
dc.date.available2014-10-07T04:36:13Z
dc.date.issued2009-01
dc.identifier.citationKunz, O., Wong, J., Janssens, J., Bauer, J., Breitenstein, O., Aberle, A.G. (2009-01). Shunting problems due to sub-micron pinholes in evaporated solid-phase crystallised poly-Si thin-film solar cells on glass. Progress in Photovoltaics: Research and Applications 17 (1) : 35-46. ScholarBank@NUS Repository. https://doi.org/10.1002/pip.866
dc.identifier.issn10627995
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/83014
dc.description.abstractRecent progress in the metallisation of poly-silicon thin-film solar cells on glass, created by solid phase crystallisation (SPC) of evaporated amorphous silicon (EVA), revealed that shunting through sub-micron holes (density 100-200 mm-2) in the films causes severe shunting problems when the air-side metal contact is deposited onto these diodes, by creating effective shunting paths between the two highly doped layers of EVA cells. We present evidence of these pinholes by optical transmission and focussed ion beam (FIB) microscopic images and confirm the point-like pinhole shunts using lock-in thermographic images. The latter revealed that the Al rear electrode induces strong ohmic shunts below the grid lines and a high density of weak nonlinear shunts away from the grid lines. Two distinctly different approaches are shown to reduce the shunting problem to a negligible level: (i) to contact only a small fraction of the rear Si surface via a point contacting scheme, whereby the metal layer needs to be thin (
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1002/pip.866
dc.sourceScopus
dc.subjectLock-in thermography
dc.subjectMetallisation
dc.subjectPolycrystalline silicon
dc.subjectShunting
dc.subjectSolid-phase crystallisation
dc.subjectThin-film solar cells
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1002/pip.866
dc.description.sourcetitleProgress in Photovoltaics: Research and Applications
dc.description.volume17
dc.description.issue1
dc.description.page35-46
dc.description.codenPPHOE
dc.identifier.isiut000262575900003
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