Please use this identifier to cite or link to this item: https://doi.org/10.1109/TIE.2013.2274422
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dc.titleMultimodal hidden markov model-based approach for tool wear monitoring
dc.contributor.authorGeramifard, O.
dc.contributor.authorXu, J.-X.
dc.contributor.authorZhou, J.-H.
dc.contributor.authorLi, X.
dc.date.accessioned2014-10-07T04:32:50Z
dc.date.available2014-10-07T04:32:50Z
dc.date.issued2014-06
dc.identifier.citationGeramifard, O., Xu, J.-X., Zhou, J.-H., Li, X. (2014-06). Multimodal hidden markov model-based approach for tool wear monitoring. IEEE Transactions on Industrial Electronics 61 (6) : 2900-2911. ScholarBank@NUS Repository. https://doi.org/10.1109/TIE.2013.2274422
dc.identifier.issn02780046
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/82731
dc.description.abstractIn this paper, a novel multimodal hidden Markov model (HMM)-based approach is proposed for tool wear monitoring (TWM). The proposed approach improves the performance of a pre-existing HMM-based approach named physically segmented HMM with continuous output (PSHMCO) by using multiple PSHMCOs in parallel. In this multimodal approach, each PSHMCO captures and emphasizes on a different tool wear regiment. In this paper, three weighting schemes, namely, bounded hindsight, discounted hindsight, and semi-nonparametric hindsight, are proposed, and two switching strategies named soft and hard switching are introduced to combine the outputs from multiple modes into one. As an illustrative example, the proposed approach is applied to TWM in a computer numerically controlled milling machine. The performance of the multimodal approach with various weighting schemes and switching strategies is reported and compared with PSHMCO. © 1982-2012 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TIE.2013.2274422
dc.sourceScopus
dc.subjectDiagnostics
dc.subjecthidden Markov model (HMM)
dc.subjectmultimodal switching
dc.subjecttool condition monitoring
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/TIE.2013.2274422
dc.description.sourcetitleIEEE Transactions on Industrial Electronics
dc.description.volume61
dc.description.issue6
dc.description.page2900-2911
dc.description.codenITIED
dc.identifier.isiut000329055300027
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