Please use this identifier to cite or link to this item: https://doi.org/10.1021/nn406201q
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dc.titleMicrosphere-coupled scanning laser confocal nanoscope for sub-diffraction-limited imaging at 25 nm lateral resolution in the visible spectrum
dc.contributor.authorYan, Y.
dc.contributor.authorLi, L.
dc.contributor.authorFeng, C.
dc.contributor.authorGuo, W.
dc.contributor.authorLee, S.
dc.contributor.authorHong, M.
dc.date.accessioned2014-10-07T04:32:27Z
dc.date.available2014-10-07T04:32:27Z
dc.date.issued2014-02-25
dc.identifier.citationYan, Y., Li, L., Feng, C., Guo, W., Lee, S., Hong, M. (2014-02-25). Microsphere-coupled scanning laser confocal nanoscope for sub-diffraction-limited imaging at 25 nm lateral resolution in the visible spectrum. ACS Nano 8 (2) : 1809-1816. ScholarBank@NUS Repository. https://doi.org/10.1021/nn406201q
dc.identifier.issn19360851
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/82698
dc.description.abstractWe report a direct optical super-resolution imaging approach with 25 nm (∼λ/17) lateral resolution under 408 nm wavelength illumination by combining fused silica and polystyrene microspheres with a conventional scanning laser confocal microscope (SLCM). The microsphere deposited on the target surface generates a nanoscale central lobe illuminating a sub-diffraction- limited cross-section located on the target surface. The SLCM confocal pinhole isolates the reflected light from the near-field subdiffractive cross-section and suppresses the noises from the side lobe and the far-field paraxial focal point. The structural detail of the subdiffractive cross-section is therefore captured, and the 2D target surface near the bottom of microspheres can be imaged by intensity-based point scanning. © 2014 American Chemical Society.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1021/nn406201q
dc.sourceScopus
dc.subjectdiffraction limit
dc.subjectimaging
dc.subjectmicrosphere
dc.subjectnanoscope
dc.subjectscanning laser confocal microscope
dc.subjectsuper-resolution
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1021/nn406201q
dc.description.sourcetitleACS Nano
dc.description.volume8
dc.description.issue2
dc.description.page1809-1816
dc.identifier.isiut000332059200078
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