Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.tsf.2010.12.023
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dc.titleFabrication and transfer of nanoporous alumina thin films for templating applications: Metal dots array deposition and porous ZnO film growth
dc.contributor.authorLiu, H.F.
dc.contributor.authorLim, E.S.
dc.contributor.authorTung, P.K.H.
dc.contributor.authorXiang, N.
dc.date.accessioned2014-10-07T04:28:09Z
dc.date.available2014-10-07T04:28:09Z
dc.date.issued2011-03-01
dc.identifier.citationLiu, H.F., Lim, E.S., Tung, P.K.H., Xiang, N. (2011-03-01). Fabrication and transfer of nanoporous alumina thin films for templating applications: Metal dots array deposition and porous ZnO film growth. Thin Solid Films 519 (10) : 3050-3054. ScholarBank@NUS Repository. https://doi.org/10.1016/j.tsf.2010.12.023
dc.identifier.issn00406090
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/82335
dc.description.abstractAn approach to fabricate nanoporous alumina thin films on aluminum foils followed by their transfer to desired substrates via chemical lift-off and Van der Waals bonding is presented. By employing a black wax technique, we demonstrate a crack free (within the area of 2 × 2 cm2) lift-off and bonding of a nanoporous alumina film with thickness of as small as ∼ 300 nm onto a substrate. The liftoff-and-bonding process changes neither the morphology nor the structure of the nanopores in the alumina film. Templating applications of the bonded alumina thin films are demonstrated and discussed. The results reveal that the alumina nanopores, combined with the liftoff-and-bonding technique, have great potential for templating applications in both nano-sized dots array deposition and functional materials growth. © 2010 Elsevier B.V. All rights Reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.tsf.2010.12.023
dc.sourceScopus
dc.subjectAluminum Anodic Films
dc.subjectBonding
dc.subjectHydrothermal deposition
dc.subjectLift-off
dc.subjectMetal dots array
dc.subjectScanning Electron Microscopy
dc.subjectX-ray diffraction
dc.subjectZinc Oxide
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1016/j.tsf.2010.12.023
dc.description.sourcetitleThin Solid Films
dc.description.volume519
dc.description.issue10
dc.description.page3050-3054
dc.description.codenTHSFA
dc.identifier.isiut000289174300009
Appears in Collections:Staff Publications

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