Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.ssc.2008.04.027
DC FieldValue
dc.titleExchange bias between NiFe and IrMn/Ru superlattices
dc.contributor.authorGuo, Z.B.
dc.contributor.authorWu, Y.H.
dc.contributor.authorHan, G.C.
dc.contributor.authorQiu, J.J.
dc.contributor.authorLiu, B.
dc.contributor.authorChantrell, R.W.
dc.date.accessioned2014-10-07T04:27:55Z
dc.date.available2014-10-07T04:27:55Z
dc.date.issued2008-07
dc.identifier.citationGuo, Z.B., Wu, Y.H., Han, G.C., Qiu, J.J., Liu, B., Chantrell, R.W. (2008-07). Exchange bias between NiFe and IrMn/Ru superlattices. Solid State Communications 147 (1-2) : 20-23. ScholarBank@NUS Repository. https://doi.org/10.1016/j.ssc.2008.04.027
dc.identifier.issn00381098
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/82314
dc.description.abstractThe letter reports on the exchange bias between NiFe and IrMn/Ru superlattices. Using the exchange bias effect we have demonstrated the presence of exchange coupling in the antiferromagnetic/nonmagnetic superlattice of IrMn/Ru and observed a larger exchange bias in NiFe/[IrMn/Ru]n than that in NiFe/IrMn bilayers. The enhancement in exchange bias should be attributed to the increase in uncompensated magnetization in IrMn/Ru superlattices. © 2008 Elsevier Ltd. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.ssc.2008.04.027
dc.sourceScopus
dc.subjectA. Magnetic films and multilayers
dc.subjectB. X-ray scattering
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1016/j.ssc.2008.04.027
dc.description.sourcetitleSolid State Communications
dc.description.volume147
dc.description.issue1-2
dc.description.page20-23
dc.description.codenSSCOA
dc.identifier.isiut000257220400006
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.