Please use this identifier to cite or link to this item: https://doi.org/10.1143/JJAP.48.081101
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dc.titleEffect of composition disorders on band structure and optical gain spectra of GaInNAs/GaAs quantum wells
dc.contributor.authorDixit, V.
dc.contributor.authorLiu, H.
dc.contributor.authorXiang, N.
dc.date.accessioned2014-10-07T04:26:28Z
dc.date.available2014-10-07T04:26:28Z
dc.date.issued2009
dc.identifier.citationDixit, V., Liu, H., Xiang, N. (2009). Effect of composition disorders on band structure and optical gain spectra of GaInNAs/GaAs quantum wells. Japanese Journal of Applied Physics 48 (8 Part 1) : 0811011-0811017. ScholarBank@NUS Repository. https://doi.org/10.1143/JJAP.48.081101
dc.identifier.issn00214922
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/82192
dc.description.abstractThe effects of non-uniform compositions (the composition disorders) of indium and nitrogen, in a Ga0.59In0.41N 0.038As0.962/GaAs singlequantum well (QW) along the growth direction, on the QW's band structure and further on its optical gain spectrum have been studied theoretically. The 10-band k-p model and the many-body optical gain model have been employed, respectively, to calculate the band structure and the optical gain of the QW. The subband energy dispersions, the optical gains of the transverse electric (TE) and transverse magnetic (TM) modes, and the radiative current densities have been investigated. The composition disorders lead to blueshift in carrier's transition energy, which is mainly due to indium composition disorder while nitrogen composition disorder only plays minor role. The TM mode optical gain is significantly enhanced and the threshold current density is increased in the composition disordered QW structure. These results may provide important supports in the design and fabrications of GaInNAs/GaAs QW based optoelectronic devices. © 2009 The Japan Society of Applied Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1143/JJAP.48.081101
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1143/JJAP.48.081101
dc.description.sourcetitleJapanese Journal of Applied Physics
dc.description.volume48
dc.description.issue8 Part 1
dc.description.page0811011-0811017
dc.identifier.isiut000269497300014
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