Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.jmmm.2004.08.023
Title: Dependence of microstructure and magnetic properties of FePt films on Cr90Ru10 underlayers
Authors: Ding, Y.F.
Chen, J.S. 
Liu, E.
Wang, J.P. 
Keywords: Cr90Ru10 underlayer
FePt film
Preferred orientation
Sputtering
Issue Date: Jan-2005
Citation: Ding, Y.F., Chen, J.S., Liu, E., Wang, J.P. (2005-01). Dependence of microstructure and magnetic properties of FePt films on Cr90Ru10 underlayers. Journal of Magnetism and Magnetic Materials 285 (3) : 443-449. ScholarBank@NUS Repository. https://doi.org/10.1016/j.jmmm.2004.08.023
Abstract: The effect of the thickness of Cr90Ru10 underlayers on the microstructure and magnetic properties of FePt films has been studied. Experimental results showed that the FePt films grown on the Cr 90Ru10 underlayers exhibited a (001) preferred orientation with out-of-plane magnetic anisotropy. The degree of the FePt(001) preferred orientation was closely related to that of the Cr(002) preferred orientation. The degree of ordering of the FePt films increased with the thickness of the Cr90Ru10 underlayers. The angular dependence of the coercivity curves suggested that an incoherent curling rotational mode be a dominant magnetic reversal mechanism in the FePt films at various Cr90Ru10 underlayer thicknesses. © 2004 Elsevier B.V. All rights reserved.
Source Title: Journal of Magnetism and Magnetic Materials
URI: http://scholarbank.nus.edu.sg/handle/10635/82121
ISSN: 03048853
DOI: 10.1016/j.jmmm.2004.08.023
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