Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/81531
DC FieldValue
dc.titleMeasurement of residual stress using fiber electronic speckle pattern interferometry
dc.contributor.authorZhang, Jingbo
dc.contributor.authorFok, Wing C.
dc.contributor.authorChong, Tow C.
dc.date.accessioned2014-10-07T03:09:19Z
dc.date.available2014-10-07T03:09:19Z
dc.date.issued1997
dc.identifier.citationZhang, Jingbo,Fok, Wing C.,Chong, Tow C. (1997). Measurement of residual stress using fiber electronic speckle pattern interferometry. Proceedings of SPIE - The International Society for Optical Engineering 2921 : 584-591. ScholarBank@NUS Repository.
dc.identifier.isbn0819423238
dc.identifier.issn0277786X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/81531
dc.description.abstractIn this paper, the evolution properties of micro-deformation field in the copper bicrystals with a symmetric tilt boundary are studied with digital speckle metrology. The micro-speckles are successfully made and the SEM speckle photographs under different loading stages are obtained. The deformation field of the copper bicrystals is quantitatively studied for the first time, and the micro-displacement field and strain field are accurately calculated. The experimental results show that, the evolution characteristics of the displacement field is obviously different from that of the macro-displacement field. These results provide some basic experimental data for the study of micromechanics.
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL ENGINEERING
dc.contributor.departmentDATA STORAGE INSTITUTE
dc.description.sourcetitleProceedings of SPIE - The International Society for Optical Engineering
dc.description.volume2921
dc.description.page584-591
dc.description.codenPSISD
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

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