Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/77087
DC FieldValue
dc.titleStudy of natural and synthetic rubies by PIXE
dc.contributor.authorTang, S.M.
dc.contributor.authorTang, S.H.
dc.contributor.authorMok, K.F.
dc.contributor.authorRetty, A.T.
dc.contributor.authorTay, T.S.
dc.date.accessioned2014-06-23T05:50:45Z
dc.date.available2014-06-23T05:50:45Z
dc.date.issued1989-02
dc.identifier.citationTang, S.M.,Tang, S.H.,Mok, K.F.,Retty, A.T.,Tay, T.S. (1989-02). Study of natural and synthetic rubies by PIXE. Applied Spectroscopy 43 (2) : 219-223. ScholarBank@NUS Repository.
dc.identifier.issn00037028
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/77087
dc.description.abstractTrace element analysis of 160 natural- and synthetic rubies were carried out by using the technique of proton-induced x-ray emission (PIXE). It was found that the natural rubies contained more and higher concentrations of impurities than did their synthetic counterparts. Results suggest that vanadium and iron are good indicators for separating synthetic rubies from the natural ones. The concentration of chromium is also helpful in many cases for source identification.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentCHEMISTRY
dc.contributor.departmentPHYSICS
dc.description.sourcetitleApplied Spectroscopy
dc.description.volume43
dc.description.issue2
dc.description.page219-223
dc.description.codenAPSPA
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

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