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|Title:||Static secondary ion mass spectrometry (SIMS) of polyanilines: A preliminary study||Authors:||Chan, H.S.O.
|Issue Date:||May-1990||Citation:||Chan, H.S.O.,Ang, S.G.,Ho, P.K.H.,Johnson, D. (1990-05). Static secondary ion mass spectrometry (SIMS) of polyanilines: A preliminary study. Synthetic Metals 36 (1) : 103-110. ScholarBank@NUS Repository.||Abstract:||Three chemically prepared polyanilines (PANIs) have been studied by static secondary ion mass spectrometry under low 'damage' conditions. Information obtained from the positive ion spectra is limited. The negative ion spectra, however, revealed fragments of up to 290 daltons which are molecular specific to provide structural information. The results suggest consecutive doping of amine and imine nitrogen atoms in parts of the polyaniline chain. © 1990.||Source Title:||Synthetic Metals||URI:||http://scholarbank.nus.edu.sg/handle/10635/77049||ISSN:||03796779|
|Appears in Collections:||Staff Publications|
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