Please use this identifier to cite or link to this item: https://doi.org/10.1143/JJAP.49.01AH05
DC FieldValue
dc.titleBand-bending at the graphene-sic interfaces: Effect of the substrate
dc.contributor.authorChen, W.
dc.contributor.authorChen, S.
dc.contributor.authorNi, Z.H.
dc.contributor.authorHuang, H.
dc.contributor.authorQi, D.C.
dc.contributor.authorGao, X.Y.
dc.contributor.authorShen, Z.X.
dc.contributor.authorWee, A.T.S.
dc.date.accessioned2014-06-23T05:32:51Z
dc.date.available2014-06-23T05:32:51Z
dc.date.issued2010
dc.identifier.citationChen, W., Chen, S., Ni, Z.H., Huang, H., Qi, D.C., Gao, X.Y., Shen, Z.X., Wee, A.T.S. (2010). Band-bending at the graphene-sic interfaces: Effect of the substrate. Japanese Journal of Applied Physics 49 (1 Part 2) : -. ScholarBank@NUS Repository. https://doi.org/10.1143/JJAP.49.01AH05
dc.identifier.issn00214922
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/75642
dc.description.abstractIn-situ synchrotron-based photoemission spectroscopy, low-temperature scanning tunneling microscopy and Raman spectroscopy are used to investigate the interface properties of graphene on both the (0001) and (0001) 6H-SiC (Si- and C-terminated surfaces). We clearly observe the upward band-bending upon the formation of interfacial graphene, which depends on the surface polarity of the underlying SiC substrate, i.e., a weak upward band bending by 0.4 eV forms on the Si-terminated 6H-SiC(0001); while a much larger upward band bending by 1.3eV appears on the C-terminated 6H-SiC(0001). © 2010 The Japan Society of Applied Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1143/JJAP.49.01AH05
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.contributor.departmentCHEMISTRY
dc.description.doi10.1143/JJAP.49.01AH05
dc.description.sourcetitleJapanese Journal of Applied Physics
dc.description.volume49
dc.description.issue1 Part 2
dc.description.page-
dc.identifier.isiut000279288900061
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.