Please use this identifier to cite or link to this item: https://doi.org/10.1143/JJAP.49.01AH05
DC FieldValue
dc.titleBand-bending at the graphene-sic interfaces: Effect of the substrate
dc.contributor.authorChen, W.
dc.contributor.authorChen, S.
dc.contributor.authorNi, Z.H.
dc.contributor.authorHuang, H.
dc.contributor.authorQi, D.C.
dc.contributor.authorGao, X.Y.
dc.contributor.authorShen, Z.X.
dc.contributor.authorWee, A.T.S.
dc.date.accessioned2014-06-23T05:32:51Z
dc.date.available2014-06-23T05:32:51Z
dc.date.issued2010
dc.identifier.citationChen, W., Chen, S., Ni, Z.H., Huang, H., Qi, D.C., Gao, X.Y., Shen, Z.X., Wee, A.T.S. (2010). Band-bending at the graphene-sic interfaces: Effect of the substrate. Japanese Journal of Applied Physics 49 (1 Part 2) : -. ScholarBank@NUS Repository. https://doi.org/10.1143/JJAP.49.01AH05
dc.identifier.issn00214922
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/75642
dc.description.abstractIn-situ synchrotron-based photoemission spectroscopy, low-temperature scanning tunneling microscopy and Raman spectroscopy are used to investigate the interface properties of graphene on both the (0001) and (0001) 6H-SiC (Si- and C-terminated surfaces). We clearly observe the upward band-bending upon the formation of interfacial graphene, which depends on the surface polarity of the underlying SiC substrate, i.e., a weak upward band bending by 0.4 eV forms on the Si-terminated 6H-SiC(0001); while a much larger upward band bending by 1.3eV appears on the C-terminated 6H-SiC(0001). © 2010 The Japan Society of Applied Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1143/JJAP.49.01AH05
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.contributor.departmentCHEMISTRY
dc.description.doi10.1143/JJAP.49.01AH05
dc.description.sourcetitleJapanese Journal of Applied Physics
dc.description.volume49
dc.description.issue1 Part 2
dc.description.page-
dc.identifier.isiut000279288900061
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

12
checked on Jun 22, 2022

WEB OF SCIENCETM
Citations

11
checked on Jun 22, 2022

Page view(s)

211
checked on Jun 23, 2022

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.