Please use this identifier to cite or link to this item: https://doi.org/10.1117/12.621762
DC FieldValue
dc.titleCheap color evaluation of dye-based pressure sensitive films for plantar studies
dc.contributor.authorYeong, W.K.
dc.contributor.authorNg, T.W.
dc.date.accessioned2014-06-19T09:49:13Z
dc.date.available2014-06-19T09:49:13Z
dc.date.issued2005
dc.identifier.citationYeong, W.K., Ng, T.W. (2005). Cheap color evaluation of dye-based pressure sensitive films for plantar studies. Proceedings of SPIE - The International Society for Optical Engineering 5852 PART II : 652-657. ScholarBank@NUS Repository. https://doi.org/10.1117/12.621762
dc.identifier.issn0277786X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/75265
dc.description.abstractDye-based pressure sensitive films are advantageous in plantar pressure studies due to their of ease of use, cost-effectiveness, and ability to produce measurements within the shoe. To circumvent the use of proprietary equipment and software to relate the dye stained film to load, an alternative approach of using a conventional flatbed scanner and generic image processing software is attempted here instead. The technique revealed high linear increasing and decreasing trends for the respective red and blue normalized intensities (correlation coefficient > 0.95) and low standard deviation in all readings (< 0.06) overall. By subtracting the blue from the red normalized intensity, it was discovered that the measurement sensitivity could be doubled. The results here confirm the viability of using a conventional flatbed scanner and generic image processing software to relate the dye stained pressure films to load. The adoption of this approach promises substantial cost savings.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1117/12.621762
dc.sourceScopus
dc.subjectBiomechanics
dc.subjectColor analysis
dc.subjectFoot
dc.subjectPlantar
dc.subjectScanner
dc.typeConference Paper
dc.contributor.departmentBACHELOR OF TECHNOLOGY PROGRAMME
dc.description.doi10.1117/12.621762
dc.description.sourcetitleProceedings of SPIE - The International Society for Optical Engineering
dc.description.volume5852 PART II
dc.description.page652-657
dc.description.codenPSISD
dc.identifier.isiut000229932000104
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