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Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/74977
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dc.titleDefect measurement using structured light system
dc.contributor.authorToh, Siew-Lok
dc.contributor.authorLow, W.K.
dc.contributor.authorTay, C.J.
dc.contributor.authorShang, H.M.
dc.contributor.authorAsundi, Anand K.
dc.date.accessioned2014-06-19T09:09:32Z
dc.date.available2014-06-19T09:09:32Z
dc.date.issued1997
dc.identifier.citationToh, Siew-Lok,Low, W.K.,Tay, C.J.,Shang, H.M.,Asundi, Anand K. (1997). Defect measurement using structured light system. Proceedings of SPIE - The International Society for Optical Engineering 2921 : 529-534. ScholarBank@NUS Repository.
dc.identifier.isbn0819423238
dc.identifier.issn0277786X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/74977
dc.description.abstractIn this paper, a new digital speckle intensity correlation searching technique which is named as 'differential oriented search' is proposed. This method effectively makes use of the distribution characteristics of the correlation functions, which makes the calculating time be considerably reduced. Experimental results shows that, the method presented here is a kind of high speed, high accurate and practical correlation metrology.
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentMECHANICAL & PRODUCTION ENGINEERING
dc.description.sourcetitleProceedings of SPIE - The International Society for Optical Engineering
dc.description.volume2921
dc.description.page529-534
dc.description.codenPSISD
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

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