Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/73986
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dc.titleTwo masks process for high aspect ratio inertial sensors with ajustable range
dc.contributor.authorIliescu, C.
dc.contributor.authorAvram, M.
dc.contributor.authorMiao, J.
dc.contributor.authorTay, F.E.H.
dc.contributor.authorXu, G.
dc.date.accessioned2014-06-19T05:41:45Z
dc.date.available2014-06-19T05:41:45Z
dc.date.issued2004
dc.identifier.citationIliescu, C.,Avram, M.,Miao, J.,Tay, F.E.H.,Xu, G. (2004). Two masks process for high aspect ratio inertial sensors with ajustable range. Proceedings of the International Semiconductor Conference, CAS 1 : 263-266. ScholarBank@NUS Repository.
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/73986
dc.description.abstractA two-mask process technology is proposed to fabricate silicon capacitive inertial sensors using comb drive structures. A conductive silicon wafer is anodically bonded on Pyrex glass substrate. The high aspect ratio silicon accelerometer structure was micromachined using DRIE and released from the glass substrate by further DRIE due to its notching effect. The spring stiffness was adjusted with another DRIE process. In this way, inertial sensors with different range can be process using same masks only by changing the spring stiffness. © 2004 IEEE.
dc.sourceScopus
dc.subjectAnodic bonding
dc.subjectComb drive
dc.subjectHigh aspect ratio
dc.subjectInertial sensors with adjustable range
dc.typeConference Paper
dc.contributor.departmentMECHANICAL ENGINEERING
dc.description.sourcetitleProceedings of the International Semiconductor Conference, CAS
dc.description.volume1
dc.description.page263-266
dc.identifier.isiutNOT_IN_WOS
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