Please use this identifier to cite or link to this item: https://doi.org/10.1117/12.814555
DC FieldValue
dc.titlePhase retrieval in digital holographic interferometry based on complex phasor and short time Fourier transform
dc.contributor.authorWen, C.
dc.contributor.authorChenggen, Q.
dc.contributor.authorJui, T.C.
dc.date.accessioned2014-06-19T05:39:00Z
dc.date.available2014-06-19T05:39:00Z
dc.date.issued2008
dc.identifier.citationWen, C., Chenggen, Q., Jui, T.C. (2008). Phase retrieval in digital holographic interferometry based on complex phasor and short time Fourier transform. Proceedings of SPIE - The International Society for Optical Engineering 7155 : -. ScholarBank@NUS Repository. https://doi.org/10.1117/12.814555
dc.identifier.isbn9780819473981
dc.identifier.issn0277786X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/73758
dc.description.abstractThe determination of phase difference distributions is important in digital holographic interferometry. Many methods can be used to determine phase difference maps, such as Fourier transform, digital phase subtraction and phase-shifting. In recent years, some time-frequency analysis methods such as wavelet transform and short time Fourier transform (STFT) are developed to extract continuous phase maps without phase unwrapping in spatial and temporal domains. In this paper, STFT is investigated for the retrieval of phase difference in digital holographic interferometry. In addition, complex phasor (CP) method is employed in advance so as to make STFT available. An experiment is conducted to show the validity of the method based on STFT.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1117/12.814555
dc.sourceScopus
dc.subjectComplex phasor
dc.subjectDigital holographic interferometry
dc.subjectPhase retrieval
dc.subjectShort time Fourier transform
dc.typeConference Paper
dc.contributor.departmentMECHANICAL ENGINEERING
dc.description.doi10.1117/12.814555
dc.description.sourcetitleProceedings of SPIE - The International Society for Optical Engineering
dc.description.volume7155
dc.description.page-
dc.description.codenPSISD
dc.identifier.isiut000261023300050
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