Please use this identifier to cite or link to this item: https://doi.org/10.1109/RAMECH.2010.5513187
DC FieldValue
dc.titleHMM with explicit state duration for prognostics in face milling
dc.contributor.authorYue, W.
dc.contributor.authorHong, G.S.
dc.contributor.authorWong, Y.S.
dc.date.accessioned2014-06-19T05:35:57Z
dc.date.available2014-06-19T05:35:57Z
dc.date.issued2010
dc.identifier.citationYue, W.,Hong, G.S.,Wong, Y.S. (2010). HMM with explicit state duration for prognostics in face milling. 2010 IEEE Conference on Robotics, Automation and Mechatronics, RAM 2010 : 218-223. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/RAMECH.2010.5513187" target="_blank">https://doi.org/10.1109/RAMECH.2010.5513187</a>
dc.identifier.isbn9781424465033
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/73508
dc.description.abstractIn this paper, the development of hidden Markov model with explicit state duration (Variable duration HMM) for face milling residual life distribution prognostics is presented. An HMM with explicit state duration is constructed by involving explicit state duration probability. The HMM with explicit state duration offers significant advantages over the conventional HMM in prognostics. The reason why including explicit duration has been both verified theoretically and experimentally in this paper. Moreover, two types of state duration pdf (Gaussian and Weibull distribution) have also been studied. VDHMM based prognostics is demonstrated with the case study which is face milling application. In the case study, the mean residual life calculated from both conventional HMM and VDHMM has been compared with the natural mean residual life. The results of the case study has shown that including the state duration as both Gaussian and Weibull distribution perform better than the conventional HMM. ©2010 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/RAMECH.2010.5513187
dc.sourceScopus
dc.subjectHidden Markov model
dc.subjectPrognostics
dc.subjectTool condition monitoring
dc.typeConference Paper
dc.contributor.departmentMECHANICAL ENGINEERING
dc.description.doi10.1109/RAMECH.2010.5513187
dc.description.sourcetitle2010 IEEE Conference on Robotics, Automation and Mechatronics, RAM 2010
dc.description.page218-223
dc.identifier.isiutNOT_IN_WOS
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