Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/73265
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dc.titleCompliance, deformation and thermal fatigue behavior of multi-copper-column interconnects
dc.contributor.authorLiao, E.B.
dc.contributor.authorTay, A.A.O.
dc.contributor.authorAng, S.S.T.
dc.contributor.authorFeng, H.H.
dc.contributor.authorNagarajan, R.
dc.contributor.authorKripesh, V.
dc.contributor.authorKumar, R.
dc.contributor.authorMahadevan, I.
dc.date.accessioned2014-06-19T05:33:04Z
dc.date.available2014-06-19T05:33:04Z
dc.date.issued2005
dc.identifier.citationLiao, E.B.,Tay, A.A.O.,Ang, S.S.T.,Feng, H.H.,Nagarajan, R.,Kripesh, V.,Kumar, R.,Mahadevan, I. (2005). Compliance, deformation and thermal fatigue behavior of multi-copper-column interconnects. Proceedings of 7th Electronics Packaging Technology Conference, EPTC 2005 1 : 209-214. ScholarBank@NUS Repository.
dc.identifier.isbn0780395786
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/73265
dc.description.abstractIn this paper, macro- and micro-modeling technique is implemented to correlate the compliance, deformation and thermal fatigue damage of composite interconnect structures that consist of copper columns and solder joint. Systematic simulation results reveal the dependence of solder joint fatigue life upon four geometric parameters such as column height, column radius, solder volume and substrate pad radius. A simple model has been developed to explain the dependence of plastic strain on the interconnect compliance. This work provides guidance for design of composite interconnect structure that is meant to enhance the solder joint reliability by incorporation of flexible strucutres. © 2005 IEEE.
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentMECHANICAL ENGINEERING
dc.description.sourcetitleProceedings of 7th Electronics Packaging Technology Conference, EPTC 2005
dc.description.volume1
dc.description.page209-214
dc.identifier.isiutNOT_IN_WOS
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