Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/72727
DC FieldValue
dc.titleLocking characteristics of semiconductor lasers with optical injection
dc.contributor.authorSeng, K.H.
dc.contributor.authorHaldar, M.K.
dc.contributor.authorMendis, F.V.C.
dc.date.accessioned2014-06-19T05:11:19Z
dc.date.available2014-06-19T05:11:19Z
dc.date.issued1996
dc.identifier.citationSeng, K.H.,Haldar, M.K.,Mendis, F.V.C. (1996). Locking characteristics of semiconductor lasers with optical injection. Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications, EDMO : 96-101. ScholarBank@NUS Repository.
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/72727
dc.description.abstractWe have studied the locking characteristics of semiconductor lasers through numerical calculation of the output intensity and change in carrier density of the slave laser during injection locking. We have also obtained the dynamic locking range by examining the roots of the secular determinant of the perturbed system. The lower boundaries of the static and dynamic locking ranges coincide, but the upper boundaries do not. Both the static and dynamic locking ranges are asymmetrical about zero detuning and dependent on injection ratio, linewidth enhancement factor and biasing condition. The upper boundary of the dynamically stable region exhibits an abrupt bend at a very low injection level. Unlike previous work, the locking characteristics at both low and high injection levels have been carefully studied.
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL ENGINEERING
dc.description.sourcetitleWorkshop on High Performance Electron Devices for Microwave and Optoelectronic Applications, EDMO
dc.description.page96-101
dc.description.coden00236
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

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