Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/72712
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dc.titleInvestigation on laser-induced effects in nanostructure fabrication with laser-irradiated scanning tunneling microscope tips in air ambient
dc.contributor.authorMai, Z.H.
dc.contributor.authorLu, Y.F.
dc.contributor.authorSong, W.D.
dc.contributor.authorChim, W.K.
dc.date.accessioned2014-06-19T05:11:09Z
dc.date.available2014-06-19T05:11:09Z
dc.date.issued2000
dc.identifier.citationMai, Z.H.,Lu, Y.F.,Song, W.D.,Chim, W.K. (2000). Investigation on laser-induced effects in nanostructure fabrication with laser-irradiated scanning tunneling microscope tips in air ambient. Materials Research Society Symposium - Proceedings 617 : J381-J386. ScholarBank@NUS Repository.
dc.identifier.issn02729172
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/72712
dc.description.abstractIn this paper, we report our investigation on the kinetics of nanostructure fabrication on gold films and on H-passivated Ge surfaces. The relationship between the current and the tip-sample distance of the STM junction was measured for both gold films and H-passivated Ge surfaces. The tip-sample distance for gold films under a electrochemically etched W tip is approximately 2 nm, while that for H-passivated Ge sufaces is more than 27 nm. The thermal expansion length of the tip under laser irradiation was calculated. From the comparison of the thermal expansion length and the tip-sample distance, we can reach the conclusion that for gold films, thermal mechanical indention is the primary reason of nanostructure formation, while for H-passivated Ge surfaces, optical enhancement is the only reason.
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL ENGINEERING
dc.contributor.departmentDATA STORAGE INSTITUTE
dc.description.sourcetitleMaterials Research Society Symposium - Proceedings
dc.description.volume617
dc.description.pageJ381-J386
dc.description.codenMRSPD
dc.identifier.isiutNOT_IN_WOS
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