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Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/72392
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dc.titleReliability by design a tool to reduce time-to-market
dc.contributor.authorFoo, S.W.
dc.contributor.authorLien, W.L.
dc.contributor.authorXie, M.
dc.contributor.authorvan Geest, E.
dc.date.accessioned2014-06-19T04:54:24Z
dc.date.available2014-06-19T04:54:24Z
dc.date.issued1995
dc.identifier.citationFoo, S.W.,Lien, W.L.,Xie, M.,van Geest, E. (1995). Reliability by design a tool to reduce time-to-market. IEEE International Engineering Management Conference : 251-256. ScholarBank@NUS Repository.
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/72392
dc.description.abstractReliability of products plays a crucial role in retaining brand loyalty. The conventional approach to reliability analysis resorts to testing the prototype and entails long development time. This is undesirable for electronic products which have very short life cycle. Reliability by design using the stressor-susceptibility interaction model provides a way to address this dilemma. Management no longer have to forgo reliability analysis in the race to shorten time-to-market.
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL ENGINEERING
dc.contributor.departmentINDUSTRIAL & SYSTEMS ENGINEERING
dc.description.sourcetitleIEEE International Engineering Management Conference
dc.description.page251-256
dc.description.codenIEMCF
dc.identifier.isiutNOT_IN_WOS
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