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Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/71883
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dc.titleStudy of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coefficient in magnetic thin films
dc.contributor.authorLeong, Siang Huei
dc.contributor.authorWang, Jian Ping
dc.contributor.authorLow, Teck Seng
dc.date.accessioned2014-06-19T03:28:55Z
dc.date.available2014-06-19T03:28:55Z
dc.date.issued2000
dc.identifier.citationLeong, Siang Huei,Wang, Jian Ping,Low, Teck Seng (2000). Study of in-depth defects using magneto-optical Kerr effect by measuring the magnetic hardness coefficient in magnetic thin films. Digests of the Intermag Conference : AE-08. ScholarBank@NUS Repository.
dc.identifier.issn00746843
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/71883
dc.description.abstractA Magneto-optical Kerr Effect (MOKE) system was built. It was demonstrated that this system is suitable for the measurement of the saturation magnetization curve and obtain the magnetic hardness coefficient.
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL ENGINEERING
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.sourcetitleDigests of the Intermag Conference
dc.description.pageAE-08
dc.description.codenDICOD
dc.identifier.isiutNOT_IN_WOS
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