Please use this identifier to cite or link to this item: https://doi.org/10.1109/ISIE.2012.6237335
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dc.titleSignature voltage identification technique for implementation of a reliable autonomous-micro-grid system
dc.contributor.authorDasgupta, S.
dc.contributor.authorMohan, S.N.
dc.contributor.authorSahoo, S.K.
dc.contributor.authorPanda, S.K.
dc.date.accessioned2014-06-19T03:27:34Z
dc.date.available2014-06-19T03:27:34Z
dc.date.issued2012
dc.identifier.citationDasgupta, S.,Mohan, S.N.,Sahoo, S.K.,Panda, S.K. (2012). Signature voltage identification technique for implementation of a reliable autonomous-micro-grid system. IEEE International Symposium on Industrial Electronics : 1634-1639. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/ISIE.2012.6237335" target="_blank">https://doi.org/10.1109/ISIE.2012.6237335</a>
dc.identifier.isbn9781467301589
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/71768
dc.description.abstractIn this paper, a plug and play type autonomous-micro-grid system is considered. Multiple distributed generating sources (DGs) and loads interactions are considered pertaining to the stability of the micro-grid. The proposed method enables communication-less operation of each of the elements of the micro-grid system. Master-slave control of the distributed generating sources is considered in a decentralized manner to stabilize the overall micro-grid system. A novel signature frequency voltage injection method is proposed to identify the presence of master distributed generator and operation of backup distributed generator. The proposed method enables the changeover of a slave DG to a master DG in the case of failure of the primary master DG without any additional communication system, increasing the reliability of the whole micro-grid system. A detailed experimental study is carried out and the experimental results presented show the efficacy of the proposed system. © 2012 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/ISIE.2012.6237335
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/ISIE.2012.6237335
dc.description.sourcetitleIEEE International Symposium on Industrial Electronics
dc.description.page1634-1639
dc.description.coden85PTA
dc.identifier.isiutNOT_IN_WOS
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