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Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1556273
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dc.titleMicrostructure and magnetic properties of CoZr thin film
dc.contributor.authorYao, X.-F.
dc.contributor.authorWang, J.-P.
dc.contributor.authorZhou, T.-J.
dc.contributor.authorChong, T.C.
dc.date.accessioned2014-06-19T03:17:57Z
dc.date.available2014-06-19T03:17:57Z
dc.date.issued2003-05-15
dc.identifier.citationYao, X.-F., Wang, J.-P., Zhou, T.-J., Chong, T.C. (2003-05-15). Microstructure and magnetic properties of CoZr thin film. Journal of Applied Physics 93 (10 3) : 8310-8312. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1556273
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/70935
dc.description.abstractThe microstructure and magnetic properties of CoZr thin films were analyzed. It was found that a change in magnetic phase occurs by annealing the as-deposited films at temperatures of above 550°C for 2 h. All the annealed films were observed to show perpendicular magnetic anisotropy.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.1556273
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1063/1.1556273
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume93
dc.description.issue10 3
dc.description.page8310-8312
dc.description.codenJAPIA
dc.identifier.isiut000182822600219
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