Please use this identifier to cite or link to this item: https://doi.org/10.1109/CLEO.2008.4551308
DC FieldValue
dc.titleLaser precision engineering from microfabrication to nanoprocessing
dc.contributor.authorHong, M.H.
dc.contributor.authorHuang, Z.Q.
dc.contributor.authorLin, Y.
dc.contributor.authorYun, J.
dc.contributor.authorTan, L.S.
dc.contributor.authorShian, L.
dc.contributor.authorChong, T.C.
dc.date.accessioned2014-06-19T03:15:58Z
dc.date.available2014-06-19T03:15:58Z
dc.date.issued2008
dc.identifier.citationHong, M.H.,Huang, Z.Q.,Lin, Y.,Yun, J.,Tan, L.S.,Shian, L.,Chong, T.C. (2008). Laser precision engineering from microfabrication to nanoprocessing. 2008 Conference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics, CLEO/QELS : -. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/CLEO.2008.4551308" target="_blank">https://doi.org/10.1109/CLEO.2008.4551308</a>
dc.identifier.isbn1557528594
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/70765
dc.description.abstractLaser precision engineering has unique advantages of non-contact process, flexible setup and high speed processing in air. In the last decades, we have witnessed its extensive applications in various production lines. Combined with other advanced processing tools, laser nanofabrication will play a much more important role in the next generation manufacturing. © 2008 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/CLEO.2008.4551308
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.contributor.departmentNUS NANOSCIENCE & NANOTECH INITIATIVE
dc.description.doi10.1109/CLEO.2008.4551308
dc.description.sourcetitle2008 Conference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics, CLEO/QELS
dc.description.page-
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.