Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3153274
DC FieldValue
dc.titleInvestigating the exchange bias in multilayer triangular nanorings
dc.contributor.authorJain, S.
dc.contributor.authorTripathy, D.
dc.contributor.authorAdeyeye, A.O.
dc.date.accessioned2014-06-19T03:14:51Z
dc.date.available2014-06-19T03:14:51Z
dc.date.issued2009
dc.identifier.citationJain, S., Tripathy, D., Adeyeye, A.O. (2009). Investigating the exchange bias in multilayer triangular nanorings. Journal of Applied Physics 105 (12) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3153274
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/70670
dc.description.abstractExchange bias effects have been systematically investigated in individual spin valve triangular rings using the synchronous transport measurement technique. Preferential pinning of antiferromagnetic (AFM) layer and ferromagnetic (FM) layer domain walls at the corners of the ring results in stronger interface coupling leading to higher blocking temperatures in the ring structure compared to the continuous film of the same film composition. At low temperature, the competition between unidirectional anisotropy and configurational anisotropy results in the formation of large domains at the corners of the ring, which results in lower values of exchange bias in the ring as compared to the continuous film. The effect of cooling field direction was also studied. We observed that the magnitude of bias obtained for negative field cooling direction is larger than that obtained for positive field cooling direction with sweeping field always starting from negative saturation. This observation has been ascribed to the dominance of FM domain magnetization determined by the external magnetic field over the cooling field which defines the AFM-FM interface coupling. © 2009 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.3153274
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1063/1.3153274
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume105
dc.description.issue12
dc.description.page-
dc.description.codenJAPIA
dc.identifier.isiut000267599600097
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.