Please use this identifier to cite or link to this item: https://doi.org/10.1109/ISIE.2012.6237250
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dc.titleIntra-cluster power management in hierarchical routing protocols for wireless sensor networks
dc.contributor.authorHoang, D.C.
dc.contributor.authorThye, C.K.
dc.contributor.authorKumar, R.
dc.contributor.authorPanda, S.K.
dc.date.accessioned2014-06-19T03:14:41Z
dc.date.available2014-06-19T03:14:41Z
dc.date.issued2012
dc.identifier.citationHoang, D.C.,Thye, C.K.,Kumar, R.,Panda, S.K. (2012). Intra-cluster power management in hierarchical routing protocols for wireless sensor networks. IEEE International Symposium on Industrial Electronics : 1147-1152. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/ISIE.2012.6237250" target="_blank">https://doi.org/10.1109/ISIE.2012.6237250</a>
dc.identifier.isbn9781467301589
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/70660
dc.description.abstractThe hierarchical routing protocol for wireless sensor networks is recognized as a technique that can reduce energy consumption of the networks and thereby increase their efficiency. Cluster head selection and network power management play important roles to improve the performance of this protocol. In this paper, a routing protocol for a small-scale wireless sensor network has been physically developed and implemented. Cluster head rotation is used to balance the energy consumption and time scheduling of the sensor node operation is carried out to achieve energy saving. The proposed work focuses on managing the energy usage within the cluster but can be extended for a large wireless sensor network facilitated by different clustering algorithms. An experimental study has been performed to compare the impact of different cluster head selection algorithms on the network's lifetime. The test results show that the network lifetime is prolonged when a voltage-based selection scheme is used for energy conservation as compared to the other algorithms. © 2012 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/ISIE.2012.6237250
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/ISIE.2012.6237250
dc.description.sourcetitleIEEE International Symposium on Industrial Electronics
dc.description.page1147-1152
dc.description.coden85PTA
dc.identifier.isiutNOT_IN_WOS
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