Please use this identifier to cite or link to this item: https://doi.org/10.1109/DTIP.2008.4752975
Title: High aspect pattern formation by integration of micro inkjetting and electroless plating
Authors: Gian, P.W.
Shan, X.
Liang, Y.N.
Lok, B.K.
Lu, C.W.
Ooi, B.L. 
Issue Date: 2008
Citation: Gian, P.W., Shan, X., Liang, Y.N., Lok, B.K., Lu, C.W., Ooi, B.L. (2008). High aspect pattern formation by integration of micro inkjetting and electroless plating. DTIP of MEMS and MOEMS - Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS : 162-167. ScholarBank@NUS Repository. https://doi.org/10.1109/DTIP.2008.4752975
Abstract: This paper reports on formation of high aspect micro patterns on low temperature co-fired ceramic (LTCC) substrates by integrating micro inkjetting with electroless plating. Micro inkjetting was realized by using an inkjetting printer that ejects ink droplets from a printhead. This printhead consists of a glass nozzle with a diameter of 50 μm and a piezoelectric transducer that is coated on the nozzle. The silver colloidal solution was inkjetted on a sintered CT800 ceramic substrate, followed by curing at 200 °C for 60 minutes. As a result, the silver trace with a thickness of 200 nm was obtained. The substrate, with the ejected silver thin film as the seed layer, was then immersed into a preinitiator solution to coat a layer of palladium for enhancing the deposition of nickel. Electroless nickel plating was successfully conducted at a rate of 0.39 μm /min, and the thickness of traces was plated up to 84 μm. This study demonstrates that the integration of inkjetting with plating is an effective method to form high aspect patterns at the demand location. ©EDA Publishing/DTIP 2008.
Source Title: DTIP of MEMS and MOEMS - Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS
URI: http://scholarbank.nus.edu.sg/handle/10635/70466
ISBN: 9782355000065
DOI: 10.1109/DTIP.2008.4752975
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.