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https://doi.org/10.1109/IPFA.2006.251050
Title: | Fabrication of high Ge content SiGe layer on Si by Ge condensation technique | Authors: | Balakumar, S. Jun Wei, T. Tung, C.H. Lo, G.Q. Nguyen, H.S. Fong, C.S. Agarwal, A. Kumar, R. Balasubramanian, N. Lee, S.J. Kwong, D.L. |
Issue Date: | 2006 | Citation: | Balakumar, S.,Jun Wei, T.,Tung, C.H.,Lo, G.Q.,Nguyen, H.S.,Fong, C.S.,Agarwal, A.,Kumar, R.,Balasubramanian, N.,Lee, S.J.,Kwong, D.L. (2006). Fabrication of high Ge content SiGe layer on Si by Ge condensation technique. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 301-305. ScholarBank@NUS Repository. https://doi.org/10.1109/IPFA.2006.251050 | Source Title: | Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA | URI: | http://scholarbank.nus.edu.sg/handle/10635/70278 | ISBN: | 1424402069 | DOI: | 10.1109/IPFA.2006.251050 |
Appears in Collections: | Staff Publications |
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