1. ScholarBank@NUS
  2. 1. Staff
  3. Staff Publications
Please use this identifier to cite or link to this item: https://doi.org/10.1361/cp2008istfa001
DC FieldValue
dc.titleEffect of refractive solid immersion lens parameters on the enhancement of laser induced fault localization techniques
dc.contributor.authorSh, G.
dc.contributor.authorAct, Q.
dc.contributor.authorCjr, S.
dc.contributor.authorCm, C.
dc.contributor.authorLs, K.
dc.contributor.authorJch, P.
dc.date.accessioned2014-06-19T03:08:04Z
dc.date.available2014-06-19T03:08:04Z
dc.date.issued2008
dc.identifier.citationSh, G., Act, Q., Cjr, S., Cm, C., Ls, K., Jch, P. (2008). Effect of refractive solid immersion lens parameters on the enhancement of laser induced fault localization techniques. Conference Proceedings from the International Symposium for Testing and Failure Analysis : 1-6. ScholarBank@NUS Repository. https://doi.org/10.1361/cp2008istfa001
dc.identifier.isbn9780871707147
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/70087
dc.description.abstractThe effect of Refractive Solid Immersion Lens (RSIL) parameters on the enhancement to laser induced fault localization techniques are investigated. Theexperimental results of the effect on a common laser induced technique, namely Thermally Induced Voltage Alteration (TIVA), and imaging are presented. A signal enhancement in the peak TIVA signal of close to 12 times has been achieved. © 2008 ASM International ®.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1361/cp2008istfa001
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.contributor.departmentBIOENGINEERING
dc.description.doi10.1361/cp2008istfa001
dc.description.sourcetitleConference Proceedings from the International Symposium for Testing and Failure Analysis
dc.description.page1-6
dc.identifier.isiut000288182500001
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.