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Please use this identifier to cite or link to this item: https://doi.org/10.1109/TMAG.2008.2002521
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dc.titleEffect of in situ FIB trimming on the spin configurations of hexagonal-shaped elements characterized by SEMPA imaging
dc.contributor.authorLua, S.Y.H.
dc.contributor.authorKushvaha, S.S.
dc.contributor.authorWu, Y.H.
dc.contributor.authorTeo, K.L.
dc.contributor.authorChong, T.C.
dc.date.accessioned2014-06-19T03:07:57Z
dc.date.available2014-06-19T03:07:57Z
dc.date.issued2008-11
dc.identifier.citationLua, S.Y.H., Kushvaha, S.S., Wu, Y.H., Teo, K.L., Chong, T.C. (2008-11). Effect of in situ FIB trimming on the spin configurations of hexagonal-shaped elements characterized by SEMPA imaging. IEEE Transactions on Magnetics 44 (11 PART 2) : 3229-3232. ScholarBank@NUS Repository. https://doi.org/10.1109/TMAG.2008.2002521
dc.identifier.issn00189464
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/70076
dc.description.abstractWe report on the effect of in situ focused ion beam (FIB) trimming on the spin configurations of the hexagonal-shaped elements, characterized by scanning electron microscopy with polarization analysis (SEMPA) imaging. The use of SEMPA and successive in situ FIB trimming makes it possible to study the effect of thickness on the spin configuration of a same hexagonal dot array, eliminating the effect of irregularity in edges caused by the fabrication processes. The results obtained indicate that there exists a transition of a single vortex state to a stable double vortex state when the thickness is reduced to below 8 nm. Micromagnetic modeling has been performed to investigate the effect of reductions in both the thickness and saturation magnetization due to FIB trimming. © 2008 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TMAG.2008.2002521
dc.sourceScopus
dc.subjectFocused ion beam (FIB)
dc.subjectMagnetic nanostructures
dc.subjectScanning electron microscopy with polarization analysis (SEMPA)
dc.subjectVortex
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/TMAG.2008.2002521
dc.description.sourcetitleIEEE Transactions on Magnetics
dc.description.volume44
dc.description.issue11 PART 2
dc.description.page3229-3232
dc.description.codenIEMGA
dc.identifier.isiut000262221200200
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