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Please use this identifier to cite or link to this item: https://doi.org/10.1109/IPFA.2006.250981
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dc.titleDC-coupled laser induced detection system for fault localization in microelectronic failure analysis
dc.contributor.authorQuah, A.C.T.
dc.contributor.authorKoh, L.S.
dc.contributor.authorChua, C.M.
dc.contributor.authorPalaniappan, M.
dc.contributor.authorChin, J.M.
dc.contributor.authorPhang, J.C.H.
dc.date.accessioned2014-06-19T03:04:34Z
dc.date.available2014-06-19T03:04:34Z
dc.date.issued2006
dc.identifier.citationQuah, A.C.T.,Koh, L.S.,Chua, C.M.,Palaniappan, M.,Chin, J.M.,Phang, J.C.H. (2006). DC-coupled laser induced detection system for fault localization in microelectronic failure analysis. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 327-332. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IPFA.2006.250981" target="_blank">https://doi.org/10.1109/IPFA.2006.250981</a>
dc.identifier.isbn1424402069
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/69780
dc.description.abstractThis paper describes a new dc-coupled laser induced detection system for fault localization in microelectronic failure analysis. This method removes artifacts inherent in ac-coupled detection systems and is capable of producing an accurate mapping of the laser induced resistance change of the devices without signal attenuation. This method is also capable of localizing large area faults without signal distortion. © 2006 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/IPFA.2006.250981
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/IPFA.2006.250981
dc.description.sourcetitleProceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
dc.description.page327-332
dc.identifier.isiutNOT_IN_WOS
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